TOD predicts target acquisition performance for staring and scanning thermal imagers
- 著者名:
- Bijl,P. ( TNO )
- Valeton,J.M.
- Jong,A.N.de
- 掲載資料名:
- Infrared imaging systems : design, analysis, modeling, and testing XI : 26-27 April 2000, Orlando, USA
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 4030
- 発行年:
- 2000
- 開始ページ:
- 96
- 終了ページ:
- 103
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819436566 [0819436569]
- 言語:
- 英語
- 請求記号:
- P63600/4030
- 資料種別:
- 国際会議録
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