Z-contrast STEM imaging and EELS of CdSe nanocrystals: Towards the analysis of individual nanocrystal surfaces
- 著者名:
- 掲載資料名:
- Semiconductor quantum dots : symposium held April 5-8, 1999, San Francisco, California, U.S.A.
- シリーズ名:
- Materials Research Society symposium proceedings
- シリーズ巻号:
- 571
- 発行年:
- 2000
- 開始ページ:
- 305
- 出版情報:
- Warrendale, PA: MRS-Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558994782 [1558994785]
- 言語:
- 英語
- 請求記号:
- M23500/571
- 資料種別:
- 国際会議録
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10
国際会議録
*DIRECT IMAGING OF THE ATOMIC STRUCTURE AND CHEMISTRY OF DEFECTS AND INTERFACES BY Z-CONTRAST STEM
Materials Research Society | |
MRS - Materials Research Society |
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