RAPID EVALUATION OF THIN FILM INTERFACIAL REACTIONS USING TEMPERATURE-RAMPED MEASUREMENTS
- 著者名:
- 掲載資料名:
- Interface control of electrical, chemical, and mechanical properties : symposium held November 29-December 3, 1993, Boston, Massachusetts, U.S.A.
- シリーズ名:
- Materials Research Society symposium proceedings
- シリーズ巻号:
- 318
- 発行年:
- 1994
- 開始ページ:
- 307
- 出版情報:
- Pittsburgh: MRS - Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558992177 [1558992170]
- 言語:
- 英語
- 請求記号:
- M23500/318
- 資料種別:
- 国際会議録
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12
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In Situ Monitoring of Thin Film Reactions During Rapid Thermal Annealing: Nickel Silicide Formation
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