X-ray Topography of a Single Superscrew Dislocation in 6H-SiC Through All {100} Faces

X-ray Topography of a Single Superscrew Dislocation in 6H-SiC Through All {100} Faces

著者名:

掲載資料名:

Defects in electronic materials II : symposium held December 2-6, 1996, Boston, Massachusetts, U.S.A.

シリーズ名:

Materials Research Society symposium proceedings

シリーズ巻号:

442

発行年:

1997

開始ページ:

661

出版情報:

Pittsburgh, Penn: MRS - Materials Research Society

ISSN:

02729172

ISBN:

9781558993464 [1558993460]

言語:

英語

請求記号:

M23500/442

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00019374
シリーズID:	PA00000011
会議名:	Symposium on defects in electronic materials
回次:	2nd
会議開催地:	Boston, MA, USA
会議開催年:	1996.12.02-1996.12.06

類似資料:

1 国際会議録 Contrast Mechanism in Superscrew Dislocation Images on Synchrotron Back-Reflection Topographs Huang, X. R., Dudley, M., Vetter, W. M., Huang, W., Wang, S., Carter, C. H., Jr. MRS - Materials Research Society	7 国際会議録 SYNCHROTRON WHITE BEAM TOPOGRAPHY STUDIES OF SCREW DISLOCATIONS IN 6H-SiC SINGLE CRYSTALS Wang, S., Dudley, M., Carter, C. H., Jr., Tsvetkov, V. F., Fazi, C. MRS - Materials Research Society
2 国際会議録 Determination of Burgers Vector of Screw Dislocations in 6H-SiC Single Crystals by Synchrotron White Beam X-ray Topography Si, W., Dudley, M., Carter, C., Glass, R., Tsvetkov, V. MRS - Materials Research Society	8 国際会議録 X-Ray Characterization of 3 Inch Diameter 4H and 6H-SiC Experimental Wafers Kuhr, T. A., Vetter, W. M., Dudley, M., Skowronski, M. Trans Tech Publications
3 国際会議録 High-Resolution X-ray Topography of Dislocations in 4H-SiC Epilayers Isaho Kamata, Hidekazu Tsuchida, William M. Vetter, Michael Dudley Materials Research Society	9 国際会議録 Simulation of Threading Edge Dislocation Images in X-Ray Topographs of Silicon Carbide Homo-Epilayers Vetter, W.M., Tsuchida, H., Kamata, I., Dudley, M. Trans Tech Publications
4 国際会議録 Synchrotron White Beam X-Ray Topography and High Resolution Triple Axis X-Ray Diffraction Studies of Defects in SiC Substrates, Epilayers and Devices Dudley, M., Huang, X., Vetter, W.M., Neudeck, P.G. Trans Tech Publications	10 国際会議録 CHARACTERIZATION OF DEFECT STRUCTURES IN LELY 6H-SiC SINGLE CRYSTALS USING SYNCHROTRON WHITE BEAM X-RAY TOPOGRAPHY Huang, W., Wang, S., Dudley, M., Neudeck, P., Powell, J. A., Fazi, C. MRS - Materials Research Society
5 国際会議録 Polytype Identification and Mapping in Heteroepitaxial Growth of 3C on Atomically Flat 4H-SiC Mesas Using Synchrotron White-Beam X-Ray Topography Dudley, M., Vetter, W.M., Huang, X.R., Neudeck, P.G., Powell, J.A. Trans Tech Publications	11 国際会議録 Synchrotron White Beam X-Ray Topography and Atomic Force Microscopy Studies of a 540R-SiC Lely Platelet Vetter, W. M., Dudley, M., Huang, W., Neudeck, P., Powell, J. A. Trans Tech Publications
6 国際会議録 Polytype Identification and Mapping in Heteroepitaxial Growth of 3C on Atomically Flat 4H-SiC Mesas Using Synchrotron White-Beam X-Ray Topography Dudley, M., Vetter, W.M., Huang, X.R., Neudeck, P.G., Powell, J.A. Trans Tech Publications	12 国際会議録 Characterization of SiC Using Synchrotron White Beam X-Ray Topography Dudley, M., Huang, X. Trans Tech Publications

1

2

3

4

5

6

7

8

9

10

11

12