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Electrical and Optical Properties of Defects by Complementary Spectroscopies

著者名:
Castaldini, A.
Cavallini, A.
Fernandez, P.
Fraboni, B.
Piqueras, J.
Polenta, L.
さらに 1 件
掲載資料名:
Electrically based microstructural characterization : symposium held November 27-30, 1995, Boston, Massachusetts, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
411
発行年:
1996
開始ページ:
177
出版情報:
Pittsburgh, Pa.: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558993143 [1558993142]
言語:
英語
請求記号:
M23500/411
資料種別:
国際会議録

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