HETEROSTRUCTURAL CHARACTERIZATION OF PSEUDOMORPHIC, PARTIALLY STRAINED, AND HIGHLY MISMATCHED SEMICONDUCTORS USING DOUBLE CRYSTAL X-RAY DIFFRACTION, TEM AND SEM | 東京工業大学附属図書館文献データベース

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HETEROSTRUCTURAL CHARACTERIZATION OF PSEUDOMORPHIC, PARTIALLY STRAINED, AND HIGHLY MISMATCHED SEMICONDUCTORS USING DOUBLE CRYSTAL X-RAY DIFFRACTION, TEM AND SEM

著者名:

Park, Hyung Moo

Park, Sin-Chong

さらに 6 件

掲載資料名:

Compound semiconductor epitaxy : symposium held April 4-7, 1994, San Francisco, California, U.S.A.

シリーズ名:

Materials Research Society symposium proceedings

シリーズ巻号:

340

発行年:

1994

開始ページ:

343

出版情報:

Pittsburgh, Pa.: MRS - Materials Research Society

ISSN:

02729172

ISBN:

9781558992405 [1558992405]

言語:

英語

請求記号:

M23500/340

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00019366
シリーズID:	PA00000011
会議名:	Symposium on compound semiconductor epitaxy
回次:	1994
会議開催地:	San Francisco, CA, USA
会議開催年:	1994.04.04-1994.04.07

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