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Impacts of the shield thickness on the induced background

著者名:
Diallo,N. ( CEA Saclay/SAP )
Collin,M.
Bersillon,O.
Cordier,B.
Morel,P.
Flament,J.L.
さらに 1 件
掲載資料名:
Gamma-ray and cosmic-ray detectors, techniques, and missions : 5-7 August 1996, Denver, Colorado
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
2806
発行年:
1996
開始ページ:
545
終了ページ:
550
出版情報:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819421944 [0819421944]
言語:
英語
請求記号:
P63600/2806
資料種別:
国際会議録

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