Particle contamination within the tungsten etch back chamber
- 著者名:
Chu,P.-T. ( Taiwan Semiconductor Manufacturing Co. ) Chang,K.-H. Peng,T.-M. Chang,C.-H. Yen,S.-W. Lin,T.-H. Chang,C.-R. - 掲載資料名:
- Microelectronic Manufacturing Yield, Reliability, and Failure Analysis
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 2635
- 発行年:
- 1995
- 開始ページ:
- 66
- 終了ページ:
- 76
- 出版情報:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819420015 [0819420018]
- 言語:
- 英語
- 請求記号:
- P63600/2635
- 資料種別:
- 国際会議録
類似資料:
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
MRS - Materials Research Society |
SPIE - The International Society of Optical Engineering |
Electrochemical Society |
Materials Research Society |
Materials Research Society |
SPIE-The International Society for Optical Engineering |
Society of Plastics Engineers |