Homogencity of Fe-doped InP wafers using optical microprobes
- 著者名:
Sanz,L.F. Gonzalez,M.A. Avella,M. Alvarez,A. Jimenez,J. Fornari,R. - 掲載資料名:
- Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997
- シリーズ名:
- Materials science forum
- シリーズ巻号:
- 258-263
- 発行年:
- 1997
- 巻:
- Part2
- 開始ページ:
- 825
- 終了ページ:
- 830
- 出版情報:
- Zurich, Switzerland: Trans Tech Publications
- ISSN:
- 02555476
- ISBN:
- 9780878497881 [0878497889]
- 言語:
- 英語
- 請求記号:
- M23650
- 資料種別:
- 国際会議録
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SPIE-The International Society for Optical Engineering |
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4
国際会議録
STUDY OF THE INHOMOGENEITIES IN SEMI-INSULATING GaAs AND InP BY SPATIALLY RESOLVED PHOTOCONDUCTIVITY
Materials Research Society |
SPIE-The International Society for Optical Engineering |
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