Blank Cover Image

High-frequency EPR studies of shallow and deep boron acceptors in 6H-SiC.(Invited)

著者名:
Schmidt,J.
Matsumoto,T.
Poluektov,O.G.
Arnold,A.
Ikoma,T.
Baranov,P.G.
Mokhov,E.N.
さらに 2 件
掲載資料名:
Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997
シリーズ名:
Materials science forum
シリーズ巻号:
258-263
発行年:
1997
巻:
Part2
開始ページ:
703
終了ページ:
708
出版情報:
Zurich, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878497881 [0878497889]
言語:
英語
請求記号:
M23650
資料種別:
国際会議録

類似資料:

Schmidt,J., Matsumoto,T.M., Poiuektov,O.G., Duijn-Arnold,A.van, Ikoma,T., Baranov,P.G., Mokhov,E.N.

Trans Tech Publications

Ilyin, I.V., Mokhov, E.N., Baranov, P.G.

Trans Tech Publications

Duijn-Arnold, A. v., Schmidt, J., Poluektov, O. G., Baranov, P. G., Mokhov, E. N.

Trans Tech Publications

Muzafarova, M. V., Ilyin, I. V., Mokhov, E. N., Baranov, P. G., Ber, B. Ya., Ionov, A. N., Kop'ev, P. S., Kaliteevskii, …

Trans Tech Publications

Duijn-Arnold, A. v., Mol, J., Verberk, R., Schmidt, J., Mokhov, E. N., Baranov, P. G.

Trans Tech Publications

von Bardeleben, H.J., Cantin, J.L., Baranov, P.G., Mokhov, E.N.

Trans Tech Publications

Baranov, P.G., Ilyin, I.V., Mokhov, E.N., von Bardeleben, H.J., Cantin, J.L.

Trans Tech Publications

Hofstaetter,A., Meyer,B.K., Scharmann,A., Baranov,P.G., Ilyin,I.V., Mokhov,E.N.

Trans Tech Publications

Ilyin, I.V., Muzafarova, M.V., Mokhov, E.N., Sankin, V.I., Baranov, P.G., Orlinskii, S.B., Schmidt, J.

Trans Tech Publications

Baranov, P.G., Ilyin, I.V., Mokhov, E.N., Khramtsov, V.A.

Trans Tech Publications

van Duijn-Arnold, A., Zondervan, R., Baranov, P.G., Mokhov, E.N., Schmidt, J.

Trans Tech Publications

Baranov,P.G.

Trans Tech Publications

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12