Studies of deep level transient spectroscopy of DX centers of GaAlAs:Te under uniaxial stress
- 著者名:
Li,M.-F. Yu,P.Y. Weber,E.R. Bauser,E. Hansen,W.L. Haller,E.E. - 掲載資料名:
- Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991
- シリーズ名:
- Materials science forum
- シリーズ巻号:
- 83-87
- 発行年:
- 1992
- 巻:
- Pt.2
- 開始ページ:
- 853
- 終了ページ:
- 858
- 出版情報:
- Zurich, Switzerland: Trans Tech Publications
- ISSN:
- 02555476
- ISBN:
- 9780878496280 [0878496289]
- 言語:
- 英語
- 請求記号:
- M23650
- 資料種別:
- 国際会議録
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3
国際会議録
LATTICE RELAXATION OF THE DX CENTERS IN Ga1-XAlXAs AND OF THE PRESSURE-INDUCED DEEP DONORS IN GaAs
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