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Passivation of shallow acceptors in Si and GaAs by annealing in H2

著者名:
Veloarisoa,I.A.
Kozuch,D.M.
Stavola,M.
Peale,R.E.
Watkins,G.D.
Pearton,S.J.
Abernathy,C.R.
Hobson,W.S.
さらに 3 件
掲載資料名:
Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991
シリーズ名:
Materials science forum
シリーズ巻号:
83-87
発行年:
1992
巻:
Pt.1
開始ページ:
111
終了ページ:
118
出版情報:
Zurich, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878496280 [0878496289]
言語:
英語
請求記号:
M23650
資料種別:
国際会議録

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