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Dynamics of defect formation in annealed InP

著者名:
  • Han,Y. ( Institute of Semiconductors (China) )
  • Liu,X. ( Institute of Semiconductors (China) )
  • Jiao,J. ( Institute of Semiconductors (China) )
  • Lin,L. ( Institute of Semiconductors (China) )
掲載資料名:
Integrated Optoelectronics II
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3551
発行年:
1998
開始ページ:
5
終了ページ:
8
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819430120 [0819430129]
言語:
英語
請求記号:
P63600/3551
資料種別:
国際会議録

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