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Imaging the evanescent intensity gradients of an optical waveguide using a tapping-mode near-field scanning optical microscope

著者名:
掲載資料名:
Design, fabrication, and characterization of photonic devices : 30 November-3 December 1999, Singapore
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3896
発行年:
1999
開始ページ:
313
終了ページ:
318
出版情報:
Bellingham, Wash., USA: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819434982 [0819434981]
言語:
英語
請求記号:
P63600/3896
資料種別:
国際会議録

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