Imaging the evanescent intensity gradients of an optical waveguide using a tapping-mode near-field scanning optical microscope
- 著者名:
- Yang,C.W. ( National Chung Cheng Univ. )
- Tsai,D.P.
- Jackson,H.E.
- 掲載資料名:
- Design, fabrication, and characterization of photonic devices : 30 November-3 December 1999, Singapore
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 3896
- 発行年:
- 1999
- 開始ページ:
- 313
- 終了ページ:
- 318
- 出版情報:
- Bellingham, Wash., USA: SPIE - The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819434982 [0819434981]
- 言語:
- 英語
- 請求記号:
- P63600/3896
- 資料種別:
- 国際会議録
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1
国際会議録
Short fiber probs scheme for tapping-mode tuning fork near-field scanning optical microscopy
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |