Far-infrared reflection-absorption investigation of SnC14 on silica and Na-modified silica surfaces using the buried metal layer approach

Far-infrared reflection-absorption investigation of SnC14 on silica and Na-modified silica surfaces using the buried metal layer approach

著者名:

Pilling,M.J. ( Univ.of Manchester Institute of Science and Technology )

掲載資料名:

Accelerator-based sources of infrared and spectroscopic applications : 19-20 July 1999, Denver, Colorado

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

3775

発行年:

1999

開始ページ:

192

終了ページ:

200

出版情報:

Bellingham, Wash.: SPIE - The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819432612 [081943261X]

言語:

英語

請求記号:

P63600/3775

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00019011
シリーズID:	PA00000029
会議名:	Optics & Photonics : Accelerator-based sources of infrared and spectroscopic applications
回次:	1999
会議開催地:	Denver, CO, USA
会議開催年:	1999.07.19-1999.07.20

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