Minideflectometer for measuring optical finish quality

Minideflectometer for measuring optical finish quality

著者名:

van Amstel,W.D. ( Philips Ctr.for Manufacturing Technology )
Baumer,S.M.B.
Couweleers,F.C.

掲載資料名:

Optical fabrication and testing : 26-28 May 1999, Berlin, Germany

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

3739

発行年:

1999

開始ページ:

363

終了ページ:

368

出版情報:

Bellingham, WA: SPIE - The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819432131 [081943213X]

言語:

英語

請求記号:

P63600/3739

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00018986
シリーズID:	PA00000029
会議名:	SPIE Optical Systems Design : Optical fabrication and testing
回次:	1999
会議開催地:	Berlin, Germany
会議開催年:	1999.05.26-1999.05.28

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