Blank Cover Image

Optical figure testing by scanning deflectometry

著者名:
掲載資料名:
Optical fabrication and testing : 26-28 May 1999, Berlin, Germany
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3739
発行年:
1999
開始ページ:
283
終了ページ:
290
出版情報:
Bellingham, WA: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819432131 [081943213X]
言語:
英語
請求記号:
P63600/3739
資料種別:
国際会議録

類似資料:

1 国際会議録 Optical figure testing by scanning deflectometry

Amstel,W.D.van, Baumer,S.M.B., Horijon,J.L.

SPIE - The International Society for Optical Engineering
7 国際会議録 A fast optical scanning deflectometer for measuring the topography of large silicon wafers

Krey, S., van Amstel, W. D., Szwedowicz, K., Campos, J., Mareno, A., Lous, E. J.

SPIE - The International Society of Optical Engineering
2 国際会議録 Optical testing of long cylindrical lenses by means of scanning deflectometry

Amstel,W.D.van, Goor,P.F.A.van de, Horijon,J.L., Nuyens,P.G.J.M.

SPIE-The International Society for Optical Engineering
8 国際会議録 A large-aperture high-energy laser system for optics and optical component testing

Nostrand, M.C., Weiland, T.L., Luthi, R.L., Vickers, J.L., Sell, W.D., Stanley, J.A., Honig, J., Auerbach, J., Hackel, …

SPIE - The International Society of Optical Engineering
3 国際会議録 Design of a compact 3D laser scanner

Geusen,M., Amstel,W.D.van, Baumer,S.M.B., Horijon,J.L.

SPIE - The International Society for Optical Engineering
9 国際会議録 Imaging the past: archaeological radar stratigraphic analysis at Mahram Bilqis

Moorman, B.J., Maillol, J.-M., Williams, J.L., Walter, F.S., Glanzman, W.D.

SPIE-The International Society for Optical Engineering
4 国際会議録 Optical system of an industrial 3D laser scanner for solder paste inspection

J.L. Horijon, W.D. van Amstel, F.C. Couweleers, W.C.M. Ligthart

Society of Photo-optical Instrumentation Engineers
10 国際会議録 Fourier transform moire deflectometry

Wang,M., Li,D., Zhong,J., Chen,W.

SPIE-The International Society for Optical Engineering
5 国際会議録 Minideflectometer for measuring optical finish quality

van Amstel,W.D., Baumer,S.M.B., Couweleers,F.C.

SPIE - The International Society for Optical Engineering
11 国際会議録 Specific Problems of the Optical Scanning System Optimization

Jung,M.S., Joo,W.D., Rodionov,S.A.

SPIE-The International Society for Optical Engineering
6 国際会議録 Large-scale high-resolution 3D laser scanner for solder-paste inspection

Horijon,J.L., Couweleers,F.C., Amstel,W.D.van

SPIE-The International Society for Optical Engineering
12 国際会議録 Integrating functions in polymer optical components

S. Bäumer, M. van der Beek

Society of Photo-optical Instrumentation Engineers
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12