On-line monitoring of PVT SiC bulk crystal growth using digital X-ray imaging
- 著者名:
Wellmann, P. J. Bickermann, M. Grau, M. Hofmann, D. Straubinger, T. L. Winnacker, A. - 掲載資料名:
- Wide-bandgap semiconductors for high-power, high-frequency, and high temperature applications--1999 : symposium held April 5-8, 1999, San Francisco, California, U.S.A.
- シリーズ名:
- Materials Research Society symposium proceedings
- シリーズ巻号:
- 572
- 発行年:
- 1999
- 開始ページ:
- 259
- 出版情報:
- Warrendale, PA: MRS-Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558994799 [1558994793]
- 言語:
- 英語
- 請求記号:
- M23500/572
- 資料種別:
- 国際会議録
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