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CHARACTERIZATION OF DEFECT STRUCTURES IN SiC SINGLE CRYSTALS USING SYNCHROTRON X-RAY TOPOGRAPHY

著者名:
掲載資料名:
Applications of synchrotron radiation techniques to materials science : symposium held April 12-15, 1993, San Francisco, California, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
307
発行年:
1993
開始ページ:
249
出版情報:
Pittsburgh, Pa.: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558992030 [1558992030]
言語:
英語
請求記号:
M23500/307
資料種別:
国際会議録

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