Amorphous Semiconductor Sample Preparation for Transmission EXAFS Measurements
- 著者名:
Ridgway, M. C. Glover, C. J. Tan, H. H. Clark, A. Karouta, F. Foran, G. J. Lee, T. W. Moon, Y. Yoon, E. Hansen, J. L. Nylandsted-Larsen, A. Clerc, C. Chaumont, J. - 掲載資料名:
- Applications of synchrotron radiation techniques to materials science IV : sympoisum held April 13-17, 1998, San Francisco, California, U.S.A.
- シリーズ名:
- Materials Research Society symposium proceedings
- シリーズ巻号:
- 524
- 発行年:
- 1998
- 開始ページ:
- 309
- 出版情報:
- Warrendale, Penn.: MRS - Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558994300 [1558994300]
- 言語:
- 英語
- 請求記号:
- M23500/524
- 資料種別:
- 国際会議録
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