In Situ Monitoring of the Electrochemical Absorption of Deuterium Into Palladium by X-ray Diffraction Using Synchrotron-Wiggler Radiation

In Situ Monitoring of the Electrochemical Absorption of Deuterium Into Palladium by X-ray Diffraction Using Synchrotron-Wiggler Radiation

著者名:

掲載資料名:

Applications of synchrotron radiation techniques to materials science IV : sympoisum held April 13-17, 1998, San Francisco, California, U.S.A.

シリーズ名:

Materials Research Society symposium proceedings

シリーズ巻号:

524

発行年:

1998

開始ページ:

127

出版情報:

Warrendale, Penn.: MRS - Materials Research Society

ISSN:

02729172

ISBN:

9781558994300 [1558994300]

言語:

英語

請求記号:

M23500/524

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00018918
シリーズID:	PA00000011
会議名:	Symposium on applications of synchrotron radiation techniques to materials science
回次:	4th
会議開催地:	San Francisco, CA, USA
会議開催年:	1998.04.13-1998.04.17

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