Contrast Mechanism in Superscrew Dislocation Images on Synchrotron Back-Reflection Topographs

Contrast Mechanism in Superscrew Dislocation Images on Synchrotron Back-Reflection Topographs

著者名:

Huang, X. R.

掲載資料名:

Applications of synchrotron radiation techniques to materials science IV : sympoisum held April 13-17, 1998, San Francisco, California, U.S.A.

シリーズ名:

Materials Research Society symposium proceedings

シリーズ巻号:

524

発行年:

1998

開始ページ:

71

出版情報:

Warrendale, Penn.: MRS - Materials Research Society

ISSN:

02729172

ISBN:

9781558994300 [1558994300]

言語:

英語

請求記号:

M23500/524

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00018918
シリーズID:	PA00000011
会議名:	Symposium on applications of synchrotron radiation techniques to materials science
回次:	4th
会議開催地:	San Francisco, CA, USA
会議開催年:	1998.04.13-1998.04.17

類似資料:

1 国際会議録 Simulation of Threading Edge Dislocation Images in X-Ray Topographs of Silicon Carbide Homo-Epilayers Vetter, W.M., Tsuchida, H., Kamata, I., Dudley, M. Trans Tech Publications	7 国際会議録 Experimental Studies of Hollow-Core Screw Dislocations in 6H-SiC and 4H-SiC Single Crystals Si,W., Dudley,M., Glass,R.C., Tsvetkov,V., ,C.H.Carter,Jr. Trans Tech Publications
2 国際会議録 X-ray Topography of a Single Superscrew Dislocation in 6H-SiC Through All {100} Faces Vetter, W. M., Dudley, M. MRS - Materials Research Society	8 国際会議録 CHARACTERIZATION OF DEFECT STRUCTURES IN SiC SINGLE CRYSTALS USING SYNCHROTRON X-RAY TOPOGRAPHY Wang, S., Dudley, M., Carter, C.,Jr., Asbury, D., Fazi, C. MRS - Materials Research Society
3 国際会議録 SYNCHROTRON WHITE BEAM TOPOGRAPHY STUDIES OF SCREW DISLOCATIONS IN 6H-SiC SINGLE CRYSTALS Wang, S., Dudley, M., Carter, C. H., Jr., Tsvetkov, V. F., Fazi, C. MRS - Materials Research Society	9 国際会議録 Synchrotron White Beam X-Ray Topography and High Resolution Triple Axis X-Ray Diffraction Studies of Defects in SiC Substrates, Epilayers and Devices Dudley, M., Huang, X., Vetter, W.M., Neudeck, P.G. Trans Tech Publications
4 国際会議録 Determination of Burgers Vector of Screw Dislocations in 6H-SiC Single Crystals by Synchrotron White Beam X-ray Topography Si, W., Dudley, M., Carter, C., Glass, R., Tsvetkov, V. MRS - Materials Research Society	10 国際会議録 A Simple Mapping Method for Elementary Screw Dislocations in Homoepitaxial SiC Layers Ha, S., Vetter, W.M., Dudley, M., Skowronski, M. Trans Tech Publications
5 国際会議録 Polytype Identification and Mapping in Heteroepitaxial Growth of 3C on Atomically Flat 4H-SiC Mesas Using Synchrotron White-Beam X-Ray Topography Dudley, M., Vetter, W.M., Huang, X.R., Neudeck, P.G., Powell, J.A. Trans Tech Publications	11 国際会議録 A Simple Mapping Method for Elementary Screw Dislocations in Homoepitaxial SiC Layers Ha, S., Vetter, W.M., Dudley, M., Skowronski, M. Trans Tech Publications
6 国際会議録 Polytype Identification and Mapping in Heteroepitaxial Growth of 3C on Atomically Flat 4H-SiC Mesas Using Synchrotron White-Beam X-Ray Topography Dudley, M., Vetter, W.M., Huang, X.R., Neudeck, P.G., Powell, J.A. Trans Tech Publications	12 国際会議録 Effects of Structural Defects on Diode Properties in 4H-SiC Skromme, B.J., Palle, K.C., Mikhov, M.K., Meidia, H., Mahajan, S., Huang, X.R., Vetter, W.M., Dudley, M., Moore, K., … Materials Research Society

1

2

3

4

5

6

7

8

9

10

11

12