In Situ TEM Analysis of TiSi2 C49-C54 Transformations During Annealing
- 著者名:
- 掲載資料名:
- Thin films - structure and morphology : symposium held December 2-6, 1996, Boston, Massachusetts, U.S.A.
- シリーズ名:
- Materials Research Society symposium proceedings
- シリーズ巻号:
- 441
- 発行年:
- 1997
- 開始ページ:
- 255
- 出版情報:
- Pittsburgh, Pa.: MRS - Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558993457 [1558993452]
- 言語:
- 英語
- 請求記号:
- M23500/441
- 資料種別:
- 国際会議録
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In Situ X-ray Diffraction Analysis of TiSi2 Phase Formation From a Titanium-Molybdenum Bilayer
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