Evaluation of No-Clean Fluxes for High Reliability Applications

Evaluation of No-Clean Fluxes for High Reliability Applications

著者名:

掲載資料名:

Electronic packaging materials science VIII : symposium held April 17-20, 1995, San Francisco, California, U.S.A.

シリーズ名:

Materials Research Society symposium proceedings

シリーズ巻号:

390

発行年:

1995

開始ページ:

231

出版情報:

Pittsburgh, Pa.: MRS - Materials Research Society

ISSN:

02729172

ISBN:

9781558992931 [1558992936]

言語:

英語

請求記号:

M23500/390

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00018906
シリーズID:	PA00000011
会議名:	Symposium on electronic packaging materials science
回次:	8th
会議開催地:	San Francisco, CA, USA
会議開催年:	1995.04.17-1995.04.20

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