Process integration of TDEAT-based MOCVD TiN as diffusion barrier for advanced Metallization
- 著者名:
- Gn,F.H. ( Chartered Semiconductor Manufacturing Ltd. )
- Li,Q.
- Chan,L.
- Chooi,S.Y.M.
- 掲載資料名:
- Microelectronic Device and Multilevel Interconnection Technology II
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 2875
- 発行年:
- 1996
- 開始ページ:
- 294
- 終了ページ:
- 300
- 出版情報:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819422736 [0819422738]
- 言語:
- 英語
- 請求記号:
- P63600/2875
- 資料種別:
- 国際会議録
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