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Wavelet-based denoising methods:a comparative study with applications in microscopy

著者名:
掲載資料名:
Wavelet applications in signal and image processing IV : 6-9 August 1996, Denver, Colorado
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
2825
発行年:
1996
巻:
Part2
開始ページ:
660
終了ページ:
671
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819422132 [0819422134]
言語:
英語
請求記号:
P63600/2825
資料種別:
国際会議録

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