Flat panel display test and evaluation for U.S.military applications

Flat panel display test and evaluation for U.S.military applications

著者名:

Quast,T. ( Air Force Wright Lab. )
Marticello,D.N.

掲載資料名:

Cockpit displays III : 10-11 April 1996 , Orlando, Florida

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

2734

発行年:

1996

開始ページ:

304

終了ページ:

310

出版情報:

Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819421159 [0819421154]

言語:

英語

請求記号:

P63600/2734

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00018869
シリーズID:	PA00000029
会議名:	Defense, Security, and Sensing : Cockpit displays
回次:	1996 : 3rd
会議開催地:	Orlando, FL, USA
会議開催年:	1996.04.10-1996.04.11

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