Resonance acceptor states and THz generation in uniaxially strained p-Ge
- 著者名:
Altukhov,I.V. Chirkova,E.G. Kagan,M.S. Korolev,K.A. Sinis,V.P. Schmalz,K. Odnoblyudov,M.A. Yassievich,I.N. - 掲載資料名:
- Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997
- シリーズ名:
- Materials science forum
- シリーズ巻号:
- 258-263
- 発行年:
- 1997
- 巻:
- Part1
- 開始ページ:
- 71
- 終了ページ:
- 76
- 出版情報:
- Zurich, Switzerland: Trans Tech Publications
- ISSN:
- 02555476
- ISBN:
- 9780878497874 [0878497870]
- 言語:
- 英語
- 請求記号:
- M23650
- 資料種別:
- 国際会議録
類似資料:
SPIE-The International Society for Optical Engineering |
Electrochemical Society |
Trans Tech Publications |
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9
国際会議録
Resonant Acceptor States and Stimulated THz Emission in Semiconductors and Semiconductor Structures
Trans Tech Publications |
Trans Tech Publications |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
Kluwer Academic Publishers |
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