X-ray diffraction line profiles due to real polycrystals
- 著者名:
- Klimanek,P.
- 掲載資料名:
- EPDIC 1 : proceedings of the First European Powder Diffraction Conference held, March 14th - 16th, 1991. in Munich, Germany
- シリーズ名:
- Materials science forum
- シリーズ巻号:
- 79-82
- 発行年:
- 1991
- 巻:
- Pt.1
- 開始ページ:
- 73
- 終了ページ:
- 84
- 出版情報:
- Aedermannsdorf, Switzerland: Trans Tech Publications
- ISSN:
- 02555476
- ISBN:
- 9780878496341 [0878496343]
- 言語:
- 英語
- 請求記号:
- M23650
- 資料種別:
- 国際会議録
類似資料:
Trans Tech Publications |
7
国際会議録
Stacking Disorder in Aurivillius Compounds Studied by X-Ray Diffraction Line Profile Analysis
Trans Tech Publications |
Trans Tech Publications |
Trans Tech Publications |
Trans Tech Publications |
Trans Tech Publications |
Trans Tech Publications |
Trans Tech Publications |
Trans Tech Publications |
11
国際会議録
Pulse transmission simulation in the system including diffraction components by real ray trace
Society of Photo-optical Instrumentation Engineers |
6
国際会議録
X-RAY DIFFRACTION LINE PROFILE ANALYSIS OF ZnO THIN FILMS DEPOSITED ON Al-SiO2-Si SUBSTRATES
Kluwer Academic Publishers |
Trans Tech Publications |