Resolution improvement technique for two-dimensional detectors

Resolution improvement technique for two-dimensional detectors

著者名:

Poletto,L. ( Univ.degli Studi di Padova(Italy) )
Nicolosi,P. ( Univ.degli Studi di Padova(Italy) )
Barana,O. ( Univ.degli Studi di Padova(Italy) )

掲載資料名:

New image processing techniques and applications : algorithms, methods, and components II : 18-19 June 1997, Munich, FRG

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

3101

発行年:

1997

開始ページ:

83

終了ページ:

94

出版情報:

Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819425218 [0819425214]

言語:

英語

請求記号:

P63600/3101

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00018800
シリーズID:	PA00000029
会議名:	Lasers, Optics, and Vision for Productivity in Manufacturing : New Image Processing Techniques and Applications
回次:	1997 : 2nd
会議開催地:	Munich, FRG
会議開催年:	1997.06.18-1997.06.19

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2 国際会議録 Stigmatic EUV spectroscopic system for emission and absorption studies of laser-produced plasmas Poletto,L., Nicolosi,P., Tondello,G. SPIE-The International Society for Optical Engineering	8 国際会議録 Grazing-incidence spectrometer for the monitoring of the VUV FEL beam at DESY (Invited Paper) Poletto, L., Epulandi, L., Nicolosi, P., Pelizzo, M.G., Zambolin, P., Feldhaus, J., Jastrow, U., Hahn, U., Ploenjes, E., … SPIE - The International Society of Optical Engineering
3 国際会議録 Energy Input to O VI Ions and Protons in the Fast Solar Wind Zangrilli, L., Poletto, G., Nicolosi, P., Noci, G., Romoli, M. ESA Publications Division	9 国際会議録 Vacuum-UV photoabsorption imaging of laser-ablated plumes Hirsch, J.S., Nicolosi, P., Poletto, L., Kennedy, E.T., Mosnier, J.-P., Neogi, A., Costello, J.T. SPIE-The International Society for Optical Engineering
4 国際会議録 Latitudinal Dependence of the Outflow Speed of the Solar Wind from UVCS Observations Zangrilli, L., Poletto, G., Nicolosi, P., Noci, G. ESA Publications Division	10 国際会議録 Grazing incidence flat-field spectrometer with spatial resolution capability for extended sources Poletto,L., Tondello,G. SPIE-The International Society for Optical Engineering
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