Direct measurements of transient structures by means of time-resolved x-ray diffraction
- 著者名:
- Chen,P. ( Univ.of California/Irvine )
- Tomov,I.V. ( Univ.of California/Irvine )
- Rentzepis,P.M. ( Univ.of California/Irvine )
- 掲載資料名:
- Laser techniques for condensed-phase and biological systems : 29-31 January 1998, San Jose, California
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 3273
- 発行年:
- 1998
- 開始ページ:
- 226
- 終了ページ:
- 234
- 出版情報:
- Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819427120 [0819427128]
- 言語:
- 英語
- 請求記号:
- P63600/3273
- 資料種別:
- 国際会議録
類似資料:
American Chemical Society |
Society of Photo-optical Instrumentation Engineers |
Society of Photo-optical Instrumentation Engineers |
SPIE - The International Society for Optical Engineering |
Kluwer Academic Publishers |
SPIE - The International Society for Optical Engineering |
4
国際会議録
Transient structures of crystals and liquids: an x-ray diffraction and EXAFS study (Invited Paper)
SPIE - The International Society of Optical Engineering |
Trans Tech Publications |
SPIE - The International Society for Optical Engineering | |
SPIE-The International Society for Optical Engineering |
Trans Tech Publications |