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Direct measurements of transient structures by means of time-resolved x-ray diffraction

著者名:
掲載資料名:
Laser techniques for condensed-phase and biological systems : 29-31 January 1998, San Jose, California
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3273
発行年:
1998
開始ページ:
226
終了ページ:
234
出版情報:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819427120 [0819427128]
言語:
英語
請求記号:
P63600/3273
資料種別:
国際会議録

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