Application of laser wavelength standard to interferometry measurements in air with nanometric accuracy
- 著者名:
- Topcu,S. ( Univ.de Technologie de Compiegne )
- Wallerand,J.P.
- Alayli,Y.
- Juncar,P.
- 掲載資料名:
- Laser diodes and leds in industrial, measurement, imaging, and sensors applications II : testing, packaging, and reliability of semiconductor lasers V : 26-25 January 2000, San Jose, California
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 3945
- 発行年:
- 2000
- 開始ページ:
- 125
- 終了ページ:
- 132
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819435620 [0819435627]
- 言語:
- 英語
- 請求記号:
- P63600/3945
- 資料種別:
- 国際会議録
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