Analysis of trace metal elements in water using laser-induced fluorescence of laser-breakdown plasma

Analysis of trace metal elements in water using laser-induced fluorescence of laser-breakdown plasma

著者名:

Nakane,M. ( Toshiba Corp. )

掲載資料名:

Laser plasma generation and diagnostics : 27 January 2000, San Jose, California

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

3935

発行年:

2000

開始ページ:

122

終了ページ:

131

出版情報:

Bellingham, Wash.: SPIE - The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819435521 [081943552X]

言語:

英語

請求記号:

P63600/3935

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00018565
シリーズID:	PA00000029
会議名:	SPIE LASE : Laser plasma generation and diagnostics
回次:	2000
会議開催地:	San Jose, CA, USA
会議開催年:	2000.01.27

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