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Polarization effects on image quality of optical systems with high numerical apertures

著者名:
掲載資料名:
Polarization: measurement, analysis, and remote sensing II : 19-21 July 1999, Denver, Colorado
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3754
発行年:
1999
開始ページ:
366
終了ページ:
373
出版情報:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819432407 [0819432407]
言語:
英語
請求記号:
P63600/3754
資料種別:
国際会議録

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