Infrared reflectance study of chemical-vapor-deposition-grown 3C-silicon carbide on silicon substrate

Infrared reflectance study of chemical-vapor-deposition-grown 3C-silicon carbide on silicon substrate

著者名:

Chang,W.Y. ( National Univ.of Singapore )
Feng,Z.C.
Chua,S.J.
Lin,J.

掲載資料名:

Optoelectronic Materials and Devices II

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

4078

発行年:

2000

開始ページ:

203

終了ページ:

210

出版情報:

Bellingham, Wash.: SPIE - The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819437174 [0819437174]

言語:

英語

請求記号:

P63600/4078

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00018522
シリーズID:	PA00000029
会議名:	Photonics Taiwan : Optoelectroflic Materials and Devices
回次:	2000 : 2nd
会議開催地:	Taipei, Taiwan
会議開催年:	2000.07.26-2000.07.28

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