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KeV ion beam induced surface modification of SiC hydrogen sensor

著者名:
掲載資料名:
Fundamental mechanisms of low-energy-beam-modified surface growth and processing : symposium held November 29-December 2, 1999, Boston, Massachusetts, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
585
発行年:
2000
開始ページ:
135
出版情報:
Warrendale, Pa.: MRS-Materials Research Society
ISSN:
02729172
ISBN:
9781558994935 [1558994939]
言語:
英語
請求記号:
M23500/585
資料種別:
国際会議録

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