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Characterization of Highly Textured PZT Thin Films Grown on LaNiO3 Coated Si Substrates by MOCVD

著者名:
Lin, C. H.
Yen, B. M.
Chen, Haydn
Wu, T. B.
Kuo, H. C.
Stillman, G. E.
さらに 1 件
掲載資料名:
Ferroelectric thin films VI : symposium held November 30-December 4, 1997, Boston, Massachusetts, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
493
発行年:
1998
開始ページ:
189
出版情報:
Pittsburgh, Pa.: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558993983 [1558993983]
言語:
英語
請求記号:
M23500/493
資料種別:
国際会議録

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