Breakdown Degradation Associated With Elementary Screw Dislocations in 4H-SiC p+n Junction Rectifiers

Breakdown Degradation Associated With Elementary Screw Dislocations in 4H-SiC p+n Junction Rectifiers

著者名:

掲載資料名:

Power semiconductor materials and devices : symposium held December 1-4, 1997, Boston, Massachusetts, U.S.A.

シリーズ名:

Materials Research Society symposium proceedings

シリーズ巻号:

483

発行年:

1998

開始ページ:

285

出版情報:

Warrendale, Penn.: MRS - Materials Research Society

ISSN:

02729172

ISBN:

9781558993884 [1558993886]

言語:

英語

請求記号:

M23500/483

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00018454
シリーズID:	PA00000011
会議名:	Symposium on power semiconductor materials and devices
回次:	1997
会議開催地:	Boston, MA, USA
会議開催年:	1997.12.01-1997.12.04

類似資料:

1 国際会議録 Nonmicropipe Dislocations in 4H-SiC Devices: Electrical Properties and Device Technology Implications Neudeck, P. G., Huang, W., Dudley, M., Fazi, C. MRS - Materials Research Society	7 国際会議録 Sense Determination of c-Axis Screw Dislocations in 4H-SiC Y. Chen, X.R. Huang, G. Dhanaraj, M. Dudley, E.K. Sanchez Trans Tech Publications
2 国際会議録 A Simple Mapping Method for Elementary Screw Dislocations in Homoepitaxial SiC Layers Ha, S., Vetter, W.M., Dudley, M., Skowronski, M. Trans Tech Publications	8 国際会議録 Polytype Identification and Mapping in Heteroepitaxial Growth of 3C on Atomically Flat 4H-SiC Mesas Using Synchrotron White-Beam X-Ray Topography Dudley, M., Vetter, W.M., Huang, X.R., Neudeck, P.G., Powell, J.A. Trans Tech Publications
3 国際会議録 A Simple Mapping Method for Elementary Screw Dislocations in Homoepitaxial SiC Layers Ha, S., Vetter, W.M., Dudley, M., Skowronski, M. Trans Tech Publications	9 国際会議録 Polytype Identification and Mapping in Heteroepitaxial Growth of 3C on Atomically Flat 4H-SiC Mesas Using Synchrotron White-Beam X-Ray Topography Dudley, M., Vetter, W.M., Huang, X.R., Neudeck, P.G., Powell, J.A. Trans Tech Publications
4 国際会議録 Homoepitaxial 'Web Growth' of SiC to Terminate C-Axis Screw Dislocations and Enlarge Step-Free Surfaces Neudeck, P.G., Powell, J.A., Trunek, A., Spry, D., Beheim, G.M., Benavage, E., Abel, P., Vetter, W.M., Dudley, M. Trans Tech Publications	10 国際会議録 Growth of Defect-Free 3C-SiC on 4H- and 6H-SiC Mesas Using Step-Free Surface Heteroepitaxy Neudeck, P.G., Powell, J.A., Trunek, A.J., Huang, X.R., Dudley, M. Trans Tech Publications
5 国際会議録 Homoepitaxial 'Web Growth' of SiC to Terminate C-Axis Screw Dislocations and Enlarge Step-Free Surfaces Neudeck, P.G., Powell, J.A., Trunek, A., Spry, D., Beheim, G.M., Benavage, E., Abel, P., Vetter, W.M., Dudley, M. Trans Tech Publications	11 国際会議録 Growth of Defect-Free 3C-SiC on 4H- and 6H-SiC Mesas Using Step-Free Surface Heteroepitaxy Neudeck, P.G., Powell, J.A., Trunek, A.J., Huang, X.R., Dudley, M. Trans Tech Publications
6 国際会議録 Studies of the Distribution of Elementary Threading Screw Dislocations in 4H Silicon Carbide Wafer Y. Chen, N. Zhang, X.R. Huang, D.R. Black, M. Dudley Trans Tech Publications	12 国際会議録 Experimental Studies of Hollow-Core Screw Dislocations in 6H-SiC and 4H-SiC Single Crystals Si,W., Dudley,M., Glass,R.C., Tsvetkov,V., ,C.H.Carter,Jr. Trans Tech Publications

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