Optoelectronic backplane interconnect technology development:POINT
- 著者名:
Liu,Y.S. ( GE Corporate Research and Development Ctr. ) Hennessy,W.B. Wojnarowski,R.J. Bristow,J.P. Liu,Y. Rowlette,J.R. Stack,J.D. Yardley,J.T. Eldada,L.A. Osgood,R.M.,Jr. Scarmozzino,R. Lee,S.H. Patra,S.K. - 掲載資料名:
- Optoelectronic Interconnects and Packaging IV
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 3005
- 発行年:
- 1997
- 開始ページ:
- 2
- 終了ページ:
- 10
- 出版情報:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819424167 [0819424161]
- 言語:
- 英語
- 請求記号:
- P63600/3005
- 資料種別:
- 国際会議録
類似資料:
SPIE-The International Society for Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
Materials Research Society |
Society of Photo-optical Instrumentation Engineers |
10
国際会議録
Size reduction in multimode interference-based NxN couplers using a tapered waveguide geometry
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
SPIE-The International Society for Optical Engineering |