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Characterization of HgCdTe epilayers grown on GaAs(211)B by molecular beam epitaxy

著者名:
掲載資料名:
Detectors, focal plane arrays, and applications : 4-5 November 1996, Beijing, China
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
2894
発行年:
1996
開始ページ:
224
終了ページ:
229
出版情報:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819422958 [0819422959]
言語:
英語
請求記号:
P63600/2894
資料種別:
国際会議録

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