Life tests of Nichia AlGaN/InGaN/GaN blue-light-emitting diodes

Life tests of Nichia AlGaN/InGaN/GaN blue-light-emitting diodes

著者名:

Helms,C.J. ( Sandia National Labs. )
Berg,N.H.
Barton,D.L.
Osinski,M.

掲載資料名:

Fabrication, testing, and reliability of semiconductor lasers : 31 January-1 February, 1996, San Jose, California

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

2683

発行年:

1996

開始ページ:

74

終了ページ:

80

出版情報:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819420572 [0819420573]

言語:

英語

請求記号:

P63600/2683

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00018403
シリーズID:	PA00000029
会議名:	Photonics West : Fabrication, testing, and reliability of semiconductor lasers
回次:	1996
会議開催地:	San Jose, CA, USA
会議開催年:	1996.01.31-1996.02.01

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