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Advanced epitaxial growth and device processing techniques for ultrahigh-speed(>40 GHz)directly modulated semiconductor lasers

著者名:
Ralston,J.D. ( SDL,Inc )
Larkins,E.C.
Eisele,K.
Weisser,S.
Burkner,S.
Schonfelder,A.
Daleiden,J.
Czotscher,K.
Esquivias,I.
Fleissner,J.
Sah,R.E.
Maier,M.
Benz,W.
Rosenzweig,J.
さらに 9 件
掲載資料名:
Fabrication, testing, and reliability of semiconductor lasers : 31 January-1 February, 1996, San Jose, California
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
2683
発行年:
1996
開始ページ:
30
終了ページ:
41
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819420572 [0819420573]
言語:
英語
請求記号:
P63600/2683
資料種別:
国際会議録

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