Blank Cover Image

Oxygen-Related Defects-Positron Interaction in Si

著者名:
Fujinami,M.  
掲載資料名:
Positron annihilation, ICPA-11 : Proceedings of the 11th International Conference on Positron Annihilation, Kansas City, Missouri, USA, May 1997
シリーズ名:
Materials science forum
シリーズ巻号:
255-257
発行年:
1997
開始ページ:
218
終了ページ:
222
出版情報:
Zuerich, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878497799 [087849779x]
言語:
英語
請求記号:
M23650
資料種別:
国際会議録

類似資料:

1 国際会議録 Study of Defect Behavior in Ion-Implanted Si Wafers by Slow Positron Annihilation Spectroscopy

Fujinami,M., Hayashi,S.

Trans Tech Publications
7 国際会議録 Defect Studies in Semiconductors

Fujinami, M., Sawada, T., Akahane, T.

Trans Tech Publications
2 国際会議録 A Study of Defects in SiO2 Films on Si by Variable-Energy Positron Annihilation Spectroscopy

Fujinami,M., Chilton,N.B.

Trans Tech Publications
8 国際会議録 Observation of Positron Induced Ion Desorption

Akahane, T., Tadokoro, S., Fujinami, M., Sawada, T.

Trans Tech Publications
3 国際会議録 Positron Beam Study of Defects Induced in Ar-Implanted Si

Miyagoe, T., Fujinami, M., Sawada, T., Suzuki, R., Ohdaira, T., Akahane, T.

Trans Tech Publications
9 国際会議録 MAGNETIC RESONANCE OF OXYGEN-RELATED DEFECTS IN SILICON

Michel J., Niklas J.R., Spaeth J. M.

Materials Research Society
4 国際会議録 Positron Trapping Defects in Neutron-Irradiated Vitreous and Crystalline SiO2

Saneyasu,M., Hasegawa,M., Tang,Z., Tabata,M., Fujinami,M., Ito,Y., Yamaguchi,S.

Trans Tech Publications
10 国際会議録 Oxygen-Related Defects in High Purity MOVPE AlGaAs

Ryan, J. M., Kuech, T. F., Bray, K. L.

MRS - Materials Research Society
5 国際会議録 Depth Dependence of Defects in Ion-Implanted Si Probed by a Positron Beam

Fujinami, M., Miyagoe, T., Sawada, T., Suzuki, R., Ohdaira, T., Akahane, T.

Trans Tech Publications
11 国際会議録 In Situ Positron Lifetime Measurement for the Strained Polyethylene

M. Fujinami, R. Minei, C.G. Liu, K. Hara

Trans Tech Publications
6 国際会議録 Oxygen related point defects in GaAs

Skowronski,M.

Trans Tech Publications
12 国際会議録 PL study of oxygen related defects in silicon

Libezny, M., Kaniava, A., Kissinger, G., Nijs, J., Claeys, C., Vanhellemont, J.

Electrochemical Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12