X-Ray Diffraction Study of Texture Evolution in Electrodeposited Zinc Layers | 東京工業大学附属図書館文献データベース

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X-Ray Diffraction Study of Texture Evolution in Electrodeposited Zinc Layers

著者名:: Tomov,I.
掲載資料名:: ICOTOM-10 : proceedings of the 10th International Conference on Textures of Materials, Clausthal, Germany, 20-24 September 1993
シリーズ名:: Materials science forum
シリーズ巻号:: 157-162
発行年:: 1994
巻:: Part2
開始ページ:: 1495
終了ページ:: 1500
出版情報:: Aedermannsdorf, Switzerland: Trans Tech Publications
ISSN:: 02555476
ISBN:: 9780878496815 [0878496815]
言語:: 英語
請求記号:: M23650
資料種別:: 国際会議録

詳細

TDL書誌ID:	ZA00018360
シリーズID:	PA00000012
会議名:	International Conference on Textures of Materials : ICOTOM
回次:	10th
会議開催地:	Clausthal, Germany
会議開催年:	1993.09.20-1993.09.24

類似資料:

1 国際会議録 X-ray diffraction method for monitoring of texture evolution in layers Tomov,I. Trans Tech Publications	7 国際会議録 Transient structures of crystals and liquids: an x-ray diffraction and EXAFS study (Invited Paper) Tomov, l. V., Chen, J., Zhang, H., Rentzepis, P. M. SPIE - The International Society of Optical Engineering
2 国際会議録 Secondary Extinction Used in Thickness and Pole Density Measurements of Textured Films by X-Ray Diffraction Tomov,I. Trans Tech Publications	8 国際会議録 Time resolved x-ray diffraction in solids and liquids Tomov V. I., Chen P., Rentzepis M. P. Kluwer Academic Publishers
3 国際会議録 X-Ray Diffraction Characterization of Textured Films Accounting for Secondary Extinction Tomov, I., Yamakov, V. Trans Tech Publications	9 国際会議録 Ultrashort hard x-ray pulses for time-resolved x-ray diffraction I.V. Tomov, P. Chen, P.M. Rentzepis Society of Photo-optical Instrumentation Engineers
4 国際会議録 Anisotropy of Secondary Extinction Coefficient in Textured Films Tomov, I. Trans Tech Publications	10 国際会議録 X-Ray Powder Diffraction Study on the Hydrothermally Obtained Zinc-Manganese Ferrites Wolska,E., Wolski,W., Kaczmarek,J. Trans Tech Publications
5 国際会議録 Single Reflection Method for Pole-Density Measurements Accounting for Secondary Extinction in Textured Films Tomov, I. Trans Tech Publications	11 国際会議録 CHARACTERIZATION OF STRESS AND TEXTURE IN RTCVD POLY-Si LAYERS BY X-RAY DIFFRACTION Barsony, Istvan, Klappe, Joe G. E., Ryan, Tom W. Materials Research Society
6 国際会議録 Accounting for Secondary Extinction in Thickness Measurement of Thin Films by X-Ray Absorption Tomov, I. Trans Tech Publications	12 国際会議録 SMA texture and reorientation: simulations and neutron diffraction studies Gao, X., Brown, D. W., Brinson, L. C. SPIE - The International Society of Optical Engineering

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