Optimization of the Texture Determination of Thin Films from X-Ray Diffraction Measurements

Optimization of the Texture Determination of Thin Films from X-Ray Diffraction Measurements

著者名:

掲載資料名:

ICOTOM-10 : proceedings of the 10th International Conference on Textures of Materials, Clausthal, Germany, 20-24 September 1993

シリーズ名:

Materials science forum

シリーズ巻号:

157-162

発行年:

1994

巻:

Part1

開始ページ:

159

終了ページ:

166

出版情報:

Aedermannsdorf, Switzerland: Trans Tech Publications

ISSN:

02555476

ISBN:

9780878496815 [0878496815]

言語:

英語

請求記号:

M23650

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00018360
シリーズID:	PA00000012
会議名:	International Conference on Textures of Materials : ICOTOM
回次:	10th
会議開催地:	Clausthal, Germany
会議開催年:	1993.09.20-1993.09.24

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