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Difference between two kinds of electron traps in BaFCI:Eu2+

著者名:
  • Wang,Y. ( Northern Jiaotong Univ.(China) )
  • Zhao,H. ( Northern Jiaotong Univ.(China) )
  • Xu,Z. ( Northern Jiaotong Univ.(China) )
  • Sun,L. ( Northern Jiaotong Univ.(China) )
  • Xu,X. ( Northern Jiaotong Univ.(China) )
掲載資料名:
Optical storage technology : 16-18 September, 1998, Beijing, China
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3562
発行年:
1998
開始ページ:
140
終了ページ:
142
出版情報:
Bellingham, Washington: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819430236 [0819430234]
言語:
英語
請求記号:
P63600/3562
資料種別:
国際会議録

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