Defects in metals - detected by spin precession methods | 東京工業大学附属図書館文献データベース

Defects in metals - detected by spin precession methods

著者名:

Wichert, Th. ( Fakultat fur Physik, Universitat Konstanz )
Recknagel, E. ( Fakultat fur Physik, Universitat Konstanz )

掲載資料名:

Nuclear and electron resonance spectroscopies applied to materials science : proceedings of the Materials Research Society Annual Meeting, November 1980, Copley Plaza Hotel, Boston, Massachusetts, U.S.A.

シリーズ名:

Materials Research Society symposia proceedings

シリーズ巻号:

3

発行年:

1981

開始ページ:

211

終了ページ:

231

出版情報:

New York, N.Y.: North Holland

ISSN:

02729172

ISBN:

9780444005977 [0444005978]

言語:

英語

請求記号:

M23500/3

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00018303
シリーズID:	PA00000010
会議名:	Materials Research Society Annual Meeting ; Symposium on nuclear and electron resonance spectroscopies applied to materials science
回次:	1980
会議開催地:	Boston, MA, USA
会議開催年:	1980.11.00

類似資料:

1 国際会議録 STRUCTURAL DEFECTS IN ION-IMPLANTED SILICON OBSERVED BY PERTURBED ANGULAR CORRELATION. DEICHER,M., GRUBEL,G., RECKNAGEL,E., WICHERT,Th. Trans Tech Publications	7 国際会議録 Trapping of Lattice Defects at 111In Atoms in Cold-Worked Copper Deicher,M., Grubel,G., Reiner,W., Wichert,Th. Trans Tech Publications
2 国際会議録 Geometrical structure of lattice defect-impurity configurations determined by TDPAC Deicher, M., Echt, O., Recknagel, E., Wichert, Th. North Holland	8 国際会議録 *CHARACTERIZATION OF DEFECT STRUCTURES BY PERTURBED ANGULAR CORRELATION TECHNIQUE Wichert, Thomas Materials Research Society
3 国際会議録 Comparative Study of Vacancy Clustering in Al and Cu Using PAC,Channeling and Positron Annihilation Wichert,Th. Trans Tech Publications	9 国際会議録 Dopant-Defect Interactions in II-VI Semiconductors Studied by PAC Wichert, Thomas MRS - Materials Research Society
4 国際会議録 Perturbed Angular Correlation Spectroscopy of In-Li Pairs in Silicon Deicher,M., Grubel,G., Keller,R., Recknagel,E., Schulz,N., Skudlik,H., Wichert,Th. Trans Tech Publications	10 国際会議録 Some applications of spin precession methods to problems in materials science Kaufmann, E.N. North Holland
5 国際会議録 Thermal Stability of Acceptor-Hydrogen Pairs in Silicon Deicher,M., Grtibel,G., Keller,R., Recknagel,E., Schulz,N., Skudlik,H., Wichert,Th. Trans Tech Publications	11 国際会議録 Defect struetures in heavily In-doped II-VI semiconductors Ostheimer,V., Fiiz,T., Hamann,J., Lauer,St., Weber,D., Wolf,H., Wichert,Th. Trans Tech Publications
6 国際会議録 Intrinsic Defects in ZnSe,ZnTe and CdS Doped with Li Wolf,H., Jost,A., Lermen,R., Filz,T., Ostheimer,V., Wichert,Th. Trans Tech Publications	12 国際会議録 Metal Vacancies in Li and In Doped ZnSe and CdS Wolf,H., Hornauer,U., Lermen,R., Edalamaw,Y., Filz,T., Krings,Th., Lauer,St., Ott,U., Singer,E., Tsige,M., Wichert,Th. Trans Tech Publications

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