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Effect of Fe and Cu contamination on the reliability of ultrathin gate oxides

著者名:
掲載資料名:
In-Line Methods and Monitors for Process and Yield Improvement
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3884
発行年:
1999
開始ページ:
124
終了ページ:
135
出版情報:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819434814 [0819434817]
言語:
英語
請求記号:
P63600/3884
資料種別:
国際会議録

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