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Formation and observation of ferroelectric domains in PbZr1-xTixO3(PZT)thin films using atomic force microscopy

著者名:
Shin,H. ( Samsung Advanced Institute of Technology )
Lee,K.
Lim,G.
Jeon,J.U.
Pak,Y.E.
Hong,S.
No,K.
さらに 2 件
掲載資料名:
Smart structures and materials 1999 : Smart materials technologies : 3-4 March 1999, Newport Beach, California
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3675
発行年:
1999
開始ページ:
94
終了ページ:
102
出版情報:
Bellingham: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819431493 [0819431494]
言語:
英語
請求記号:
P63600/3675
資料種別:
国際会議録

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