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Photoreflection spectrum on Si-surface-delta-doped GaAs

著者名:
Lu,W. ( Shanghai Institute of Technical Physics )
Liu,X.
Chen,X.
Shi,G.L.
Qiao,Y.M.
Shen,S.C.
Fu,Y.
Willander,M.
さらに 3 件
掲載資料名:
Photodetectors : materials and devices IV : 27-29 January 1999, San Jose, California
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3629
発行年:
1999
開始ページ:
409
終了ページ:
414
出版情報:
Bellingham, Wash., USA: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819430991 [0819430994]
言語:
英語
請求記号:
P63600/3629
資料種別:
国際会議録

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